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Metal Analysis
Glow Discharge OES (GDOES / GDS)
Glow spectrometer GDS8000
Part Number:
GDS8000
The GDS8000 is a high-performance glow discharge optical emission spectrometer designed for fast depth profiling and surface-layer elemental analysis in solid materials. It meets rigorous national standards (GB/T19502, GB/T22368, GB/T22462) and is suited for analyzing coatings, multilayers, and ultra-thin films in industries including semiconductors, photovoltaics, batteries, and nanomaterials. It offers rapid, accurate layer-by-layer elemental determination with no need for sample dissolution.
Fast Depth Profiling
Offers high sputtering rates (> 1 µm/min) and excellent depth resolution (1–2 nm), with coverage from 1 nm to 200 µm.
Broad Spectral Range & High Resolution
Wavelength coverage of 120–800 nm with spectral resolution between 18–25 pm using a PMT detector array.
Multiplexed Element Detection
Up to 48 simultaneous element channels; no dilution or sample pretreatment needed—enabling direct solid sample analysis.
Turnkey Depth Profiling System
Integrated opto-mechanical-electrical design ensures robust, precise operation ideal for surface and coating characterization.
Standards-Compliant & Industry-Ready
Certified across key Chinese standards for GDOES, suitable for high-end tech, coatings, and battery material analysis.
Specification | Value |
---|---|
Model | GDS8000 (also labeled GD‑OES8000) |
Excitation Mode | DC or RF glow discharge |
Wavelength Range | 120–800 nm |
Spectral Resolution | 18–25 pm |
Depth Resolution | 1–2 nm |
Sputtering Rate | > 1 µm/min |
Depth Range | 1 nm to 200 µm |
Optical Focal Length | 998.8 mm |
Element Channels | 48 |
Detector Type | Photomultiplier Tube (PMT) |
Photomultiplier Tube (PMT) | Coating and surface layer analysis, multilayers, nano-films |